Hitachi S-4300 Cold Field Emission Scanning Electron Microscope

* Entry Level High Resolution CFE SEM
* Familiar Windows XP Operating System
* Proven Cold Field Emission Gun and Vacuum Technology
* Specimen Exchange Chamber Provides High Throughput
* Robinson BSED Provided as Standard

The S-4300 continues the Hitachi tradition of setting the standard for high resolution imaging as well as unparalled uptime. Over 25 years of cold cathode field emission design experience has been incorporated into a robust imaging and analytical tool that can be utilized by SEM users of all skill levels. The S-4300’s chamber design enhances versatility of the SEM by the addition of a variety of accessories such as a cryogenic stage or an EBIC imaging system. In short, the S-4300 CFE SEM provides the user with powerful imaging and analytical capabilities in one easy to use low cost package.

Specifications

Secondary Electron Image Resolution: 1.5nm @ 15kV
Electron Gun: Cold Cathode Field Emission
Specimen Size: 150mm with large Eucentric Stage