Nikon ECLIPSE L200A Automated IC Inspection Microscope with AF for DIC Observation

Nikon Updated: 2008-04-14 RSS
Nikon ECLIPSE L200A Automated IC Inspection Microscope with AF for DIC Observation

Major operations of the L200A are motorized and can be preset for instant recall. This eliminates deviations in inspection results and enables the standardization of inspection. Moreover, it features not only performance at the world's highest level, but also the flexibility to accept various accessories according to application.

• Major operations such as focusing, aperture, brightfield/darkfield changeover, light intensity are motorized

• Most advanced CFI60 optical system

• Flare is minimized for high contrast

• New objectives with a 60mm parfocal distance provide both high NA’s and long working distances

• Complete anti-contamination design

• Brightfield and darkfield illuminators built in

Equipped with AF; for DIC observation

• Nomarski prism in the nosepiece supports all objectives—Single DIC system—to produce DIC images with minimum deviation in color density

• Control of the prism can be motorized

(Digital camera in the photo is an option)