Nikon ECLIPSE L200D IC Inspection Microscope
Nikon Updated: 2008-04-14 RSSECLIPSE L200D for Diascopic Brightfield, Episcopic Darkfield, and DIC Observations
Incorporating the CFI60 optical system boasting optical performance at the world's highest level, it minimizes flare to deliver high contrast.
• New objectives with a 60mm parfocal distance provide both high NA’s and long working distances
• Complete anti-contamination design
• Brightfield and darkfield illuminators built in
For diascopic brightfield, episcopic darkfield, and DIC observations
• Supports both diascopic and episcopic illuminations
• Nomarski prism in the nosepiece supports all objectives—Single DIC system—to produce DIC images with minimum deviation in color density
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No manuals currently available for this model.
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No manuals currently available for this model.
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