Olympus OmniScan MX ECA Portable Eddy Current Flaw Detector

Olympus Updated: 2007-09-11
Olympus OmniScan MX ECA Portable Eddy Current Flaw Detector

Eddy Current Array Technology
Eddy current array (ECA) technology allows to electronically drive and read several eddy current sensors positioned side-by-side in the same probe assembly. Data acquisition is made possible through the use of multiplexing, which avoids mutual inductance between the individual sensors.

The OmniScan™ ECA test configuration supports 32 sensor coils (up to 64 with an external multiplexer) working in bridge or transmit-receive mode. The operating frequency ranges from 20 Hz to 6 MHz with the option of using multiple frequencies in the same acquisition.

Benefits of Eddy Current Arrays
Compared to single-channel eddy current technology, eddy current array technology provides the following benefits:

* Drastically reduces inspection time.
* Covers a large area in one single pass.
* Reduces the complexity of mechanical and robotic scanning systems.
* Provides real-time cartography of the inspected region, facilitating data interpretation.
* Is well suited for complex part geometries.
* Improves reliability and probability of detection (POD).

Eddy Current Array Probes
Olympus NDT manufactures R/D Tech ECA probes for a wide range of applications. Probes can be designed to detect a specific type of flaw or to follow the shape of the part to inspect. Standard designs are available to detect defects such as cracks and pitting, and subsurface defects like cracks in multilayer structures as well as corrosion.