http://www.generalmanual.com/Measuring-Systems/index.htm Measuring Systems en-us 2007 GeneralManual.Com http://www.generalmanual.com/Measuring-Systems/Nikon-CFI-Plan-Apochromat-Series-for-Phase-Contrast-Microscopy.htm Correction for chromatic aberration has been improved and now extends across the entire visible spectrum to include the violet wavelength. Wed, 20 Jun 2007 02:23:38 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-CFI-Plan-Fluor-ELWD-Series-Objective-Lenses-for-Phase-Contrast-Microscopy.htm CFI Plan Fluor ELWD objectives are well suited for fluorescence observations, especially with inverted microscopes. Wed, 20 Jun 2007 02:21:20 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-CFI-Apochromat-TIRF-Series-Objective-Lenses.htm ApoTIRF objectives provide chromatic correction from 435nm to an incredible 1064nm. Wed, 20 Jun 2007 02:00:37 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-CFI-Plan-Apochromat-Series-Objective-Lenses.htm The CFI Plan Apochromat series features longer working distances with high Numerical Apertures and is designed to correct all optical aberrations throughout the visible spectrum from violet to red from center to edges across the entire 25mm field of Wed, 20 Jun 2007 01:58:22 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-CFI-Plan-Apochromat-VC-Series-Objective-Lenses.htm The CFI Plan Apochromat VC series are top performance objectives with perfect correction of chromatic aberrations in the visible light range and excellent resolution throughout the field of view. Wed, 20 Jun 2007 01:55:53 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-CFI-Plan-Apochromat-Series-Objective-Lenser-for-Phase-Contrast-Microscopy.htm Correction for chromatic aberration has been improved and now extends across the entire visible spectrum to include the violet wavelength. Wed, 20 Jun 2007 01:38:32 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-iNEXIV-VMA-2520-Multi-Sensor-Measuring-System.htm The iNEXIV VMA-2520 is a new multi-sensor measuring system that's lightweight and compact enough to be used in the factory on the bench top Wed, 20 Jun 2007 01:32:56 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-NEXIV-VMR-1515-CNC-Video-Measuring-System.htm Nikon's NEXIV VMR-1515 is an automated small-size CNC non-contact measuring instrument featuring TTL Laser height/profile scanning, intelligent pattern recognition and low contrast edge measuring. Wed, 20 Jun 2007 01:27:50 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-NEXIV-VMR-3020-CNC-Video-Measuring-System.htm Features an 8-segment LED illumination system and through-the-lens laser auto-focus, allowing for ultra-accurate detection of measurement points. Wed, 20 Jun 2007 01:24:34 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-NEXIV-VMR-6555-CNC-Video-Measuring-System.htm The NEXIV VMR-6555 is a large stage bridge automated CNC non-contact measuring instrument. Wed, 20 Jun 2007 01:20:14 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-NEXIV-VMR-10080-CNC-Video-Measuring-System.htm Among its many features is a 1000 x 800 x 150 mm stage stroke, bright diascopic illumination, pinpoint laser autofocusing, and advanced search functions Wed, 20 Jun 2007 01:14:53 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-NEXIV-VMR-H3030-CNC-Video-Measuring-System.htm It features a 300 x 300 x 150mm stage, TTL Laser height/profile scanning, intelligent pattern recognition and low contrast edge measuring. Wed, 20 Jun 2007 01:11:42 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-NEXIV-Confocal-CNC-Video-Measuring-System.htm Nikon's Confocal NEXIV VMR-K3040ZC addresses the metrology needs of complex IC packages resulting from the enormous demand for reliable semiconductor products. Wed, 20 Jun 2007 01:07:22 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-NEXIV-FOUP-CNC-Video-Measuring-System.htm The NEXIV VM-450C detects hard to see edges using a variety of illumination features as well as Nikon's unique image processing technologies. Wed, 20 Jun 2007 01:03:51 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-V-24B-Profile-Projector.htm The Nikon V-24B, with a large 600mm diameter protractor screen and a heavy-duty 9 x 4 inch linear encoder stage Wed, 20 Jun 2007 00:58:47 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-V-12B-Series-Profile-Projector.htm These projectors feature a 12" diameter screen and accept larger stages with higher accuracy thanks to the movable head during focusing. Wed, 20 Jun 2007 00:56:33 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-Horizon-14E-Profile-Projector.htm The Horizon 14E offers the finest resolution, clarity, contrast and edge-to-edge image sharpness available in a 14" comparator. Wed, 20 Jun 2007 00:49:57 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-V-20B-Profile-Projector.htm With improved image brightness and resolution, the V-20B delivers images with excellent clarity, while enabling observation in a comfortable posture. Wed, 20 Jun 2007 00:46:14 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-Horizon-16E-Profile-Projector.htm The Horizon 16E offers the finest resolution, clarity, contrast and edge-to-edge image sharpness available in a 16" comparator. Wed, 20 Jun 2007 00:43:02 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-6B-Autocollimator.htm The 6B brightfield model projects a dark cross and illuminates the surface so you can see details. Wed, 20 Jun 2007 00:38:21 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-6D-Autocollimator.htm Nikon's 6B autocollimator checks alignment and measures very small angular deviations to measure flatness or height by simple geometry. Wed, 20 Jun 2007 00:34:21 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-MF-501-Digimicro-Digital-Height-Measuring-System.htm It features a measuring length equal to 50mm and accuracy of 1 micron at 20ˇăC. Wed, 20 Jun 2007 00:31:48 -0600 http://www.generalmanual.com/Measuring-Systems/Nikon-MF-1001-Digimicro-Digital-Height-Measuring-System.htm The MF-1001 is a compact digital micrometer offering flawless contact measurements of dimensions, thickness and depth. Wed, 20 Jun 2007 00:27:51 -0600