Nikon Eclipse LV-DAF Dynamic Auto Focus Unit
Nikon Updated: 2009-04-07 RSSThe perfect auto-focus system solution for Eclipse LV microscopes and OEM applications.
The LV-DAF delivers fast, versatile autofocus with the Hybrid Auto-Focus system, making the most of two types of auto focus systems. Combining slit projection and contrast detection auto focus, it features large focus range and fast tracking ability. A variety of observation methods are supported, including brightfield, darkfield and differential interference contrast (DIC), as well as various transparent samples.
Hybrid Auto-Focus
There are two common types of auto-focus systems for microscopes:
slit projection and contrast detection.
Slit projection system projects a slit image and then detects the shift in the reflected light. This system is useful when a large focal range is necessary.
Contrast detection system projects a slit pattern and then detects the contrast of the reflected light. This system is useful when focus accuracy is needed. This is possible because this auto-focus system is less affected by sample surface variation.
Hybrid Auto-Focus combines the advantages of both systems and makes the most of their paired potential.
Large Focal Range
Focal range is remarkably larger than with contrast detection alone. This means that samples with distortions on their surface, such as a liquid crystal substrate, can be rapidly tracked, thereby enabling speedy focusing.
LED Light Source
The LV-DAF uses a bright LED for the auto-focus light source. And since it also automatically adjusts the auto-focus light volume for the sample, it can support samples ranging from low to high reflectivity.
Multiple Observation Methods
A wide range of observation methods is supported, including brightfield, darkfield, and DIC. Reflective samples and transparent samples are also supported.
Auto-Adjustment Program
The Auto-Adjustment Program, included as standard, enables simple and speedy system setup. The program performs immediate auto-adjustment after the user focuses the system and presses the button to start the setup. It is also possible to automatically set/register optimal parameters for each type of sample and recall them in accordance to the sample being photographed.
Control
The LV-DAF can be controlled from a PC or a DS-L2 digital camera system for microscopes via USB or RS232C.
Compatibility with LV Series Microscopes
The LV-DAF can be combined with other LV series products. When combined with the LV-ECON, it enables observation under the optimal conditions for each particular sample.
Design
The controller features the same hardware design as the LV-ECON and has a compact footprint that allows them to be stacked on each other and used anywhere.
Software Development Kit
Nikon provides a software development kit (SDK) for integrating the LV-DAF into a variety of systems. (Compatibility is only guaranteed for Nikon products.)
Specifications
Detection system: Hybrid system combining slit projection with contrast detection
Auto-focus light source: Near-IR LED (λ = 770 nm)
Objective lens: CFI60 objective lens 2.5x-100x (includes extra-long working distance (ELWD), super-long working distance (SLWD), and CR for LCD substrate inspection)
Auto-focus modes: Continuous mode and search mode (single, continuous)
Focal range: Focal range without searching (brightfield); 2.5x: 5.5 mm or more, 5x: 4.5 mm or more, 10x: 1.3 mm or more, 20x: 320 μm or more, 50x: 50 μm or more, 100x: 10 μm or more
Focal time: 0.7 seconds or less (20x: 200μm with no search)
Focal precision (repeated reproducibility): 1/2 or less of focal depth
AF offset feature: Enables observation with precise adjustment of focal position while applying auto-focus
Minimum drive resolution: 0.05 μm
External communication: RS232C, USB, and parallel I/O
Power source: 100-240 V AC, 1.0 A, 50/60 Hz
Brochure
Related Manuals
Nikon DS-Ri1 Microscope Camera
Nikon Eclipse MA200 Inverted Metallurgical Microscope
Nikon MM200 Measuring Microscope
Nikon SMZ445-460 Zoom Stereomicroscope
Hitachi TM-1000 Tabletop Microscope
Hitachi H-9500 300kV Transmission Electron Microscope
Hitachi HD-2300A Scanning Transmission Electron Microscope
Hitachi HD-2700 Cs Corrected Scanning Transmission Electron Microscope
Hitachi S-3700N Ultra Large VP Scanning Electron Microscope
Hitachi S-3400N Fully Automated VP Scanning Electron Microscope
Hitachi S-4300 SE/N Variable Pressure Field Emission Scanning Electron Microscope
Hitachi S-4300 Cold Field Emission Scanning Electron Microscope